SIFT-Rank: Ordinal description for invariant feature correspondence
SIFT-Rank: Ordinal description for invariant feature correspondence
Matthew Toews, William III Wells
».IEEE Conference onComputer Vision and Pattern Recognition, 2009. CVPR 2009(Miami, FL, USA, June 20-25, 2009)p. 172-177.Piscataway, NJ, USA : IEEE Computer Society.