Using a deformation field model for localizing faces and facial points under weak supervision

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Using a deformation field model for localizing faces and facial points under weak supervision
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Marco Pedersoli, Tinne Tuytelaars, Luc Van Gool
IEEE Conference on Computer Vision and Pattern Recognition (CVPR)(Columbus, OH, United states, June 23-28, 2014)p. 3694-3701.IEEE Computer Society.

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