Inspection of metallic surfaces using Local Binary Patterns

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Inspection of metallic surfaces using Local Binary Patterns

Mansano, M., Pavesi, L., Oliveira, L. S., Britto Jr, A. and Koerich, A..

In 37th Annual Conference of the IEEE Industrial Electronics Society, IECON 2011, November 7, 2011 – November 10, 2011 (Melbourne, VIC, Australia, Nov. 7-10, 2011) Coll. « IECON Proceedings (Industrial Electronics Conference) »p. 2227-2231.Melbourne, VIC, Australia : IEEE Computer Society. Compte des citations dans Scopus : 6. 2011

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