MOSFET threshold extraction from voltage-only measurements

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MOSFET threshold extraction from voltage-only measurements

Schneider, M. C., Galup-Montoro, C., Koerich, A. L. and Pinto, R. L. O..

In IX Brazilian Microelectronics Congress (SBMICRO’1994) (Rio de Janeiro, Brazil, Aug., 1994)p. 216-222. Compte des citations dans Scopus : 7. 1994

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