SIFT-Rank: Ordinal description for invariant feature correspondence

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SIFT-Rank: Ordinal description for invariant feature correspondence

Toews, Matthew and Wells, William III.

In IEEE Conference onComputer Vision and Pattern Recognition, 2009. CVPR 2009 (Miami, FL, USA, June 20-25, 2009)p. 172-177.Piscataway, NJ, USA : IEEE Computer Society. Compte des citations dans Scopus : 35. 2009

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